Abstract:
The Fourier transform and the general methods of linear system theory are very important in the analysis of optical imaging systems. These tools are used to analyze a double-slit intensity pattern as measured by an optical fiber bundle connected to an inexpensive PASCO photodetector. The three important functions involved in this analysis are the input intensity function to the detector, the output of the detector and the response function which characterizes the detection system. The recorded data of the intensity pattern includes the effects of both noise and modification of the detection system. We have developed methods to eliminate these two effects and obtain an unspoiled double-slit diffraction pattern. These methods are discussed with a view towards developing an improved system in the future.
